The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Oct. 29, 2024

Filed:

Feb. 19, 2020
Applicants:

Yuji Toriumi, Tokyo, JP;

Hiroyuki Satoh, Kanagawa, JP;

Inventors:

Yuji Toriumi, Tokyo, JP;

Hiroyuki Satoh, Kanagawa, JP;

Assignee:

RICOH COMPANY, LTD., Tokyo, JP;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G02B 13/00 (2006.01); G02B 27/10 (2006.01); G02B 27/00 (2006.01);
U.S. Cl.
CPC ...
G02B 13/0065 (2013.01); G02B 13/0045 (2013.01); G02B 27/1066 (2013.01); G02B 27/0025 (2013.01);
Abstract

An imaging optical system includes a plurality of optical systems each including a plurality of optical members, a first reflection member, disposed for each one of the optical systems, configured to reflect light when the light passing through the plurality of optical members, and a variable aperture member having an opening disposed at an image sensor side when viewed from the first reflection member, the variable aperture member configured to change a size of the opening through which the light reflected from the first reflection member passes through, and at least a part of the variable aperture member is disposed at a position overlapping with an area corresponding to a first lens, disposed at the most object side in the plurality of optical members, along an optical axis direction.


Find Patent Forward Citations

Loading…