The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Oct. 29, 2024

Filed:

Oct. 20, 2022
Applicant:

Fujifilm Healthcare Corporation, Kashiwa, JP;

Inventors:

Tomoki Amemiya, Chiba, JP;

Toru Shirai, Chiba, JP;

Atsuro Suzuki, Chiba, JP;

Yukio Kaneko, Chiba, JP;

Hiroki Shoji, Chiba, JP;

Keisuke Nishio, Chiba, JP;

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01R 33/56 (2006.01); G01R 33/561 (2006.01); G06T 11/00 (2006.01);
U.S. Cl.
CPC ...
G01R 33/5608 (2013.01); G01R 33/5611 (2013.01); G06T 11/008 (2013.01); G06T 2211/424 (2013.01);
Abstract

Provided is a method for performing reconstruction and noise removal with high accuracy on various undersampling patterns including equidistant undersampling. An image processing unit that processes measurement data acquired by an MRI apparatus performs image reconstruction by using measurement data on respective channels measured in a predetermined undersampling pattern and sensitivity distributions of respective reception coils. At this time, denoising of a reconstructed image and a calculation for maintaining consistency between original measurement data and the measurement data on the respective channels created from denoised images are sequentially processed. Accordingly, image restoration and denoising with high accuracy are possible without depending on the undersampling pattern.


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