The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Oct. 29, 2024

Filed:

Apr. 23, 2021
Applicant:

Technische Universität München, Munich, DE;

Inventors:

Andreas Deeg, Munich, DE;

Dominik Bucher, Puchheim, DE;

Assignee:
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01V 3/00 (2006.01); G01R 33/30 (2006.01); G01R 33/32 (2006.01); G01N 21/64 (2006.01); G01N 24/10 (2006.01);
U.S. Cl.
CPC ...
G01R 33/323 (2013.01); G01R 33/30 (2013.01); G01N 21/64 (2013.01); G01N 24/10 (2013.01);
Abstract

Disclosed herein is a sensor chip for parallelized magnetic sensing of a plurality of samples, a system for parallelized magnetic sensing of a plurality of samples and a method for probing a plurality of samples using optically addressable solid-state spin systems. The sensor chip comprises an optically transparent substrate comprising a plurality of optically addressable solid-state spin systems arranged in a plurality of sensing regions in a surface layer below a top surface of the substrate. The sensor chip further comprises a plurality of sample sites, wherein each sample site is arranged above a respective sensing region. The sensor chip has a light guiding system configured to provide an optical path through the substrate connecting each of the sensing regions.


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