The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Oct. 29, 2024

Filed:

May. 13, 2022
Applicant:

Cornerstone Research Group, Inc., Miamisburg, OH (US);

Inventors:

James E. Shepherd, Porter Ranch, CA (US);

Mary T. Parrish, Kettering, OH (US);

Ian M. Fuller, Bellbrook, OH (US);

Ryan D. Snyder, Dayton, OH (US);

Assignee:

Cornerstone Research Group, LLC, Miamisburg, OH (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01N 35/00 (2006.01); B33Y 30/00 (2015.01); B33Y 50/00 (2015.01);
U.S. Cl.
CPC ...
G01N 35/00584 (2013.01); B33Y 30/00 (2014.12); B33Y 50/00 (2014.12);
Abstract

In-line material analyzers may include feed guides for guiding a material through the analyzer. An actuator may be positioned and configured to contact the material proximate to the feed guides. The state of the actuator, and the force applied by the actuator to the material, may be detected. The state of the actuator, the force applied by the actuator, or both may be utilized to determine one or more properties of the material. Such a determination may be made without removing the material from a production or other manufacturing line, such as, for example, while the material remains contiguous with a source from which the material is extruded.


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