The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Oct. 29, 2024

Filed:

Apr. 07, 2020
Applicant:

Polymer Technology Systems, Inc., Whitestown, IN (US);

Inventors:

Jonathan A. Broadwell, Beech Grove, IN (US);

James Miller, Indianapolis, IN (US);

Assignee:

Polymer Technology Systems, Inc., Whitestown, IN (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01N 33/487 (2006.01); B01L 3/00 (2006.01);
U.S. Cl.
CPC ...
G01N 33/48785 (2013.01); B01L 3/502715 (2013.01); B01L 2300/0654 (2013.01); B01L 2300/0825 (2013.01);
Abstract

In one embodiment, a system for a configurable meter for analyte testing includes a meter, the meter configured to respond to commands in a first protocol and thereby control an analysis system for detecting an analyte level of an analyte, a display, and an input device. The system further includes a removable chip insertable into the meter, the removable chip configured to execute a protocol when mated with the meter and send the commands in the first protocol to control the meter, the removable chip further configured to calculate the analyte level as part of the protocol.


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