The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Oct. 29, 2024

Filed:

Apr. 29, 2022
Applicant:

Taiwan Textile Research Institute, New Taipei, TW;

Inventors:

Pei-Te Shen, New Taipei, TW;

Hung-Yu Lin, New Taipei, TW;

Chin-Lun Chu, New Taipei, TW;

Yu-Sian Ciou, New Taipei, TW;

Tzu-Yu Chiu, New Taipei, TW;

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01N 33/36 (2006.01);
U.S. Cl.
CPC ...
G01N 33/367 (2013.01);
Abstract

A method of predicting fabric features is disclosed herein, and the method includes following operations. Inputting first fabric information of a first fabric. Generating first fabric feature values of the first fabric. Performing a first calculation on the first fabric information and the first fabric feature values. Generating feature parameters and first predicted feature values of the first fabric by the first calculation. Inputting second fabric information of a second fabric. Generating second fabric feature values of the second fabric according to the second fabric information and the feature parameters. A system of predicting fabric features is also disclosed herein.


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