The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Oct. 29, 2024
Filed:
Sep. 13, 2022
Topcon Corporation, Tokyo, JP;
Takeshi Kikuchi, Tokyo, JP;
TOPCON CORPORATION, Tokyo, JP;
Abstract
Provided is a hammering test system. A hammering test system includes a hammering test device including a target, a traveling mechanism for automatically traveling on a to-be-tested surface, a marking mechanism configured to perform marking on the to-be-tested surface, an adsorbing mechanism for adsorbing to the to-be-tested surface, and a hammering test mechanism configured to conduct a hammering test on the to-be-tested surface, and a surveying instrument capable of performing automatic tracking and distance and angle measurements of the target. A hammering test is conducted by causing the hammering test device to travel to a desired position while adsorbing to a to-be-tested surface by the adsorbing mechanism. When it is determined that there is an abnormality, a marking is marked on the to-be-tested surface. The surveying instrument automatically tracks the target, and when conducting a hammering test, makes distance and angle measurements of the target.