The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Oct. 29, 2024

Filed:

Dec. 21, 2021
Applicant:

Ta Instruments-waters Llc, New Castle, DE (US);

Inventor:

David L. Dingmann, Saint Paul, MN (US);

Assignee:

TA Instruments-Waters LLC, New Castle, DE (US);

Attorneys:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01N 3/02 (2006.01);
U.S. Cl.
CPC ...
G01N 3/02 (2013.01);
Abstract

Disclosed is a material testing system that includes a fixture, a frame, a load sensor, a displacement sensor and a computer system coupled to the material testing system. The computer system includes one or more processors, one or more memory devices coupled to the one or more processors, one or more computer readable storage devices coupled to the one or more processors, wherein the one or more storage devices contain program code executable by the one or more processors via the one or more memory devices to implement a method for detecting a change in a material testing sequence. A computer program product that implements a method for detecting a change in a material test sequence, and methods for detecting a change in a material test sequence or fatigue test is further disclosed.


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