The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Oct. 29, 2024

Filed:

Jan. 27, 2020
Applicant:

Furukawa Electric Co., Ltd., Tokyo, JP;

Inventor:

Hiroshi Kaneko, Tokyo, JP;

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
C22C 21/08 (2006.01); C22C 21/02 (2006.01); C22F 1/043 (2006.01); C22F 1/047 (2006.01); C22F 1/05 (2006.01);
U.S. Cl.
CPC ...
C22C 21/08 (2013.01); C22C 21/02 (2013.01); C22F 1/043 (2013.01); C22F 1/047 (2013.01); C22F 1/05 (2013.01);
Abstract

An aluminum alloy that has high yield strength enabling use as a substitute for iron- and copper-based metal materials, and has a constant break elongation even at narrow diameters. The aluminum alloy has an alloy composition containing 0.20-1.80 mass % of Mg, 0.20-2.00 mass % of Si, and 0.01-1.50 mass % of Fe, with a balance being Al and inevitable impurities. The aluminum alloy material has a fibrous metallic microstructure in which a plurality of crystal grains extend so as to be aligned in one direction, and in a cross section parallel to the one direction, an average value of a maximum dimension in a direction perpendicular to the longitudinal direction of a plurality of the crystal grains is no more than 400 nm, and viewing the cross section in a thickness direction, when observing at a central part, specific voids having a maximum dimension in a direction perpendicular to the longitudinal direction of no less than 1.0 μm are not present, or an existence number of the specific voids is no more than 15 per 10000 μm.


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