The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Oct. 29, 2024

Filed:

Sep. 20, 2022
Applicant:

Argo Ai, Llc, Pittsburgh, PA (US);

Inventors:

Casey J. Sennott, Pittsburgh, PA (US);

Morgan M. Wagner, Pittsburgh, PA (US);

Dustin Ryan Yautz, Wexford, PA (US);

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
B60W 50/02 (2012.01); B60Q 11/00 (2006.01); B60S 1/46 (2006.01); B60S 1/54 (2006.01); B60W 50/04 (2006.01);
U.S. Cl.
CPC ...
B60W 50/0205 (2013.01); B60Q 11/00 (2013.01); B60S 1/46 (2013.01); B60S 1/54 (2013.01); B60W 50/04 (2013.01); B60W 2050/0215 (2013.01); B60W 2556/20 (2020.02); B60W 2556/25 (2020.02);
Abstract

Devices, systems, and methods are provided for enhanced sensor cleaning validation. A device may receive a signal from a sensor indicative of an obstruction on the sensor. The device may activate a cleaning system at a degree of actuation responsive to the obstruction. The device may then obtain a first post-clean performance measurement of the sensor. The device may then adjust the degree of actuation of the cleaning system based on a degradation measurement between a baseline performance measurement associated with a clean performance baseline of the sensor and the first post-clean performance measurement.


Find Patent Forward Citations

Loading…