The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Oct. 29, 2024

Filed:

Jun. 10, 2020
Applicant:

Nikon Slm Solutions Ag, Luebeck, DE;

Inventors:

Christiane Thiel, Luebeck, DE;

Daniel Brueck, Luebeck, DE;

Assignee:

NIKON SLM Solutions AG, Luebeck, DE;

Attorneys:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
B22F 10/366 (2021.01); B22F 10/28 (2021.01); B22F 10/36 (2021.01); B22F 10/38 (2021.01); B22F 10/85 (2021.01); B22F 12/44 (2021.01); B22F 12/45 (2021.01); B22F 12/49 (2021.01); B22F 12/90 (2021.01); B28B 1/00 (2006.01); B33Y 10/00 (2015.01); B33Y 30/00 (2015.01); B33Y 50/02 (2015.01); B22F 12/41 (2021.01);
U.S. Cl.
CPC ...
B22F 10/366 (2021.01); B22F 10/28 (2021.01); B22F 10/36 (2021.01); B22F 10/38 (2021.01); B22F 10/85 (2021.01); B22F 12/45 (2021.01); B22F 12/49 (2021.01); B22F 12/90 (2021.01); B28B 1/001 (2013.01); B33Y 10/00 (2014.12); B33Y 30/00 (2014.12); B33Y 50/02 (2014.12); B22F 12/41 (2021.01); B22F 12/44 (2021.01);
Abstract

An apparatus for producing a three-dimensional work piece is provided. The apparatus comprises an irradiation unit comprising at least one scanning unit configured to scan a radiation beam over an uppermost layer of raw material powder to predetermined sites of the uppermost layer of the raw material powder in order to solidify the raw material powder at the predetermined sites. An axis corresponding to the radiation beam when it impinges on the uppermost layer of raw material powder at an angle of 90° is defined as a central axis for the scanning unit. The apparatus further comprises a control unit configured to receive work piece data indicative of at least one layer of the three-dimensional work piece to be produced, and assign at least a part of a contour of the layer of the three-dimensional work piece to the at least one scanning unit. According to a first aspect, the control unit is configured to generate control data for controlling the irradiation unit, the control data defining a scan strategy of the radiation beam such that for more than 50% of a predefined length, the radiation beam moves away from the central axis, the predefined length being defined as a length the radiation beam moves along the contour assigned to the at least one scanning unit, excluding sections concentric with regard to the central axis. Further, corresponding methods and computer program products are provided.


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