The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Oct. 29, 2024
Filed:
Mar. 31, 2020
Applicant:
Nikon Slm Solutions Ag, Luebeck, DE;
Inventors:
Assignee:
NIKON SLM Solutions AG, Lübeck, DE;
Attorneys:
Primary Examiner:
Int. Cl.
CPC ...
B22F 10/31 (2021.01); B22F 12/17 (2021.01); B22F 12/30 (2021.01); B22F 12/41 (2021.01); B22F 12/90 (2021.01); B33Y 30/00 (2015.01); B33Y 50/02 (2015.01); B29C 64/386 (2017.01); B33Y 50/00 (2015.01);
U.S. Cl.
CPC ...
B22F 10/31 (2021.01); B22F 12/17 (2021.01); B22F 12/30 (2021.01); B22F 12/41 (2021.01); B22F 12/90 (2021.01); B33Y 30/00 (2014.12); B33Y 50/02 (2014.12); B22F 2203/11 (2013.01);
Abstract
We describe a calibration method for calibrating one or more optical elements of an additive layer manufacturing apparatus useable for producing a three-dimensional workpiece, the method comprising: projecting, using the one or more optical elements, an optical pattern onto a material in order to prepare, from said material, solidified material layers using an additive layer manufacturing technique to form a test sample; determining a geometry of the test sample; comparing the determined geometry with a nominal geometry to generate calibration data; and calibrating the one or more optical elements using said calibration data.