The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Oct. 29, 2024

Filed:

May. 26, 2023
Applicants:

Tianjin Eye Hospital, Tianjin, CN;

Wenzhou University of Technology, Wenzhou, CN;

Inventors:

Yan Wang, Tianjin, CN;

Xuan Chen, Tianjin, CN;

Zuoping Tan, Tianjin, CN;

Riwei Wang, Tianjin, CN;

Assignees:
Attorneys:
Primary Examiner:
Int. Cl.
CPC ...
A61B 3/10 (2006.01); A61B 3/00 (2006.01); A61B 3/02 (2006.01); A61B 3/107 (2006.01); A61B 3/14 (2006.01);
U.S. Cl.
CPC ...
A61B 3/107 (2013.01); A61B 3/0025 (2013.01); A61B 3/145 (2013.01);
Abstract

The present disclosure relates to a subtle cornea deformation identification method and device based on a pixel-level corneal biomechanical parameter, including the following steps: step 1, sampling and analyzing a dynamic video of corneal stress deformation in a historical database, and calculating pixel-level data; and step 2, configuring an ensemble classifier based on a sampling result and detecting a local change in corneal biomechanics, thus identifying a subtle cornea deformation. The present disclosure has high measurement accuracy and is capable of detecting a local subtle biomechanical change.


Find Patent Forward Citations

Wang, Yan. (2024). Subtle cornea deformation identification method and device based on pixel-level corneal biomechanical parameter (U.S. Patent No. 12127789). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/12127789

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

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