The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Oct. 22, 2024

Filed:

Mar. 29, 2021
Applicant:

Qualcomm Incorporated, San Diego, CA (US);

Inventors:

Wooseok Nam, San Diego, CA (US);

Yucheng Dai, San Diego, CA (US);

Juan Montojo, San Diego, CA (US);

Tao Luo, San Diego, CA (US);

Peter Gaal, San Diego, CA (US);

Sony Akkarakaran, Poway, CA (US);

Assignee:

QUALCOMM Incorporated, San Diego, CA (US);

Attorneys:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
H04L 12/00 (2006.01); H04W 24/08 (2009.01); H04W 24/10 (2009.01);
U.S. Cl.
CPC ...
H04W 24/08 (2013.01); H04W 24/10 (2013.01);
Abstract

Various aspects of the present disclosure generally relate to wireless communication. In some aspects, a user equipment (UE) may receive a measurement configuration that is associated with a common measurement object or a common resource pool for at least two of cross-link interference (CLI) measurements, self-interference (SI) measurements, or wireless sensing measurements. The UE may perform, based at least in part on the measurement configuration, one or more measurements that include at least one of a CLI measurement, an SI measurement, or a wireless sensing measurement. The UE may transmit, based at least in part on the measurement configuration, a measurement report indicating at least one measurement of the one or more measurements. Numerous other aspects are described.


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