The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Oct. 22, 2024
Filed:
May. 17, 2022
Nokia Solutions and Networks Oy, Espoo, FI;
Doutje Van Veen, New Providence, NJ (US);
Amitkumar Mahadevan, Edison, NJ (US);
Vincent Houtsma, New Providence, NJ (US);
Nokia Solutions and Networks Oy, Espoo, FI;
Abstract
A method and apparatus is proposed for accurately evaluating the performance of optical transmitters under test conditions (such as high bit-rate modulation formats) that compromise the operability of standard test equipment used for this purpose. The proposed apparatus and method are similar to the elements associated with existing testing standards based on an optical eye diagram, with an important distinction that allows for accurate measurements of the transmitter's performance to be made. In particular, the sampling point for collecting eye diagram data samples in the inventive arrangement is shifted by half a period with respect to the conventional mid-eye sampling point, eliminating the need to include representative reference equalizer in the test equipment and providing an evaluation not influenced by the test equipment, resulting in a more accurate measurement of transmitter-related distortions.