The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Oct. 22, 2024
Filed:
Aug. 10, 2022
Screen Holdings Co., Ltd., Kyoto, JP;
Tomohiro Suzuki, Kyoto, JP;
SCREEN HOLDINGS CO., LTD., Kyoto, JP;
Abstract
An image inspection device includes: an inspection condition setting unit for setting, as an inspection condition, a determination criterion when detecting a defective image; an imaging unit that performs capturing a print image and outputs a captured image obtained by the capturing; and a defective image detection unit that detects a defective image from the captured image on the basis of the inspection condition. The inspection condition setting unit is configured to be able to set, as the inspection condition, first parameter values and second parameter values that are two different determination criteria. The defective image detection unit performs first detection processing of detecting a defective image from the captured image on the basis of the first parameter values and second detection processing of detecting a defective image from the captured image on the basis of the second parameter values.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile