The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Oct. 22, 2024

Filed:

Nov. 01, 2022
Applicant:

Renesas Electronics Corporation, Tokyo, JP;

Inventors:

Wataru Saito, Tokyo, JP;

Fukashi Morishita, Tokyo, JP;

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H03M 1/10 (2006.01); H03M 1/68 (2006.01); H04N 23/45 (2023.01); H04N 25/69 (2023.01); H04N 25/78 (2023.01);
U.S. Cl.
CPC ...
H03M 1/1071 (2013.01); H04N 23/45 (2023.01); H04N 25/69 (2023.01); H04N 25/78 (2023.01); H03M 1/68 (2013.01);
Abstract

A semiconductor device includes a digital-analog converter provided with a plurality of current cells, and a test circuit electrically connected to the digital-analog converter to test the digital-analog converter. The test circuit includes: a charge information holding circuit that holds, as differential charge information, a difference value between a first charge according to a first current and a second charge according to a second current by at least one or more current cells among the plurality of current cells; a reference voltage generation circuit that generates a reference voltage to be comparative object; and a comparison circuit that compares a determination voltage according to the differential charge information and the reference voltage to output a comparison result.


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