The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Oct. 22, 2024
Filed:
Dec. 09, 2020
Amazon Technologies, Inc., Seattle, WA (US);
Nayana Teja Chiluvuri, Seattle, WA (US);
Chang Hwa Rob Yang, Sammamish, WA (US);
Xunwei Yu, Kirkland, WA (US);
Kenneth Lawrence Staton, San Carlos, CA (US);
Cameron Dean Whitehouse, Seattle, WA (US);
Matthew L. Chaboud, San Francisco, CA (US);
Sajesh Kumar Saran, Bothell, WA (US);
Pushkaraksha Gejji, San Jose, CA (US);
Krzysztof Marcin Walczak, Seattle, WA (US);
Amazon Technologies, Inc., Seattle, WA (US);
Abstract
Described is an apparatus to concurrently measure multiple input voltages at a high sampling data rate, such as at least two mega-samples per second. The apparatus may include a plurality of voltage data acquisition components that concurrently sample different input voltages and produce respective voltage data samples. Each of the plurality of voltage data acquisition components may be directly coupled to a field programmable gate array that receives the voltage data samples, packetizes those voltage data samples, and provide the packetized voltage data samples to a system on chip.