The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Oct. 22, 2024

Filed:

Jun. 09, 2023
Applicant:

Purdue Research Foundation, West Lafayette, IN (US);

Inventors:

Robert Graham Cooks, West Lafayette, IN (US);

Alan Keith Jarmusch, Lafayette, IN (US);

Valentina Pirro, West Lafayette, IN (US);

Assignee:

Purdue Research Foundation, West Lafayette, IN (US);

Attorneys:
Primary Examiner:
Int. Cl.
CPC ...
H01J 49/04 (2006.01); A61B 5/00 (2006.01); A61B 5/145 (2006.01); A61B 10/02 (2006.01); A61F 13/38 (2006.01); G01N 30/72 (2006.01); H01J 49/16 (2006.01); G01N 1/02 (2006.01);
U.S. Cl.
CPC ...
H01J 49/0459 (2013.01); A61B 5/14503 (2013.01); A61B 5/7282 (2013.01); A61B 10/02 (2013.01); A61F 13/38 (2013.01); G01N 30/72 (2013.01); H01J 49/0409 (2013.01); H01J 49/165 (2013.01); G01N 2001/028 (2013.01);
Abstract

The invention generally relates to systems and methods for sample analysis using swabs. In certain aspects, the invention provides systems that include a probe having a conductive proximal portion coupled to a porous material at a distal portion of the probe that is configured to retain a portion of a sample that has contacted the porous material, and a mass spectrometer having an inlet. The system is configured such that the porous material at a distal portion of the probe is aligned over the inlet of the mass spectrometer.


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