The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Oct. 22, 2024

Filed:

Feb. 25, 2020
Applicants:

Universiteit Antwerpen, Antwerp, BE;

Imec Vzw, Leuven, BE;

Universiteit Gent, Ghent, BE;

Inventors:

Wouter Van Putte, Diksmuide, BE;

Jean-Pierre Timmermans, Mol, BE;

Jan Vanfleteren, Gentbrugge, BE;

Assignees:

UNIVERSITEIT ANTWERPEN, Antwerp, BE;

IMEC VZW, Leuven, BE;

UNIVERSITEIT GENT, Ghent, BE;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H01J 37/26 (2006.01); B01J 19/00 (2006.01);
U.S. Cl.
CPC ...
H01J 37/261 (2013.01); B01J 19/0046 (2013.01); B01J 2219/00432 (2013.01);
Abstract

An electron microscopy grid, includes: (i) a perforated substrate, (ii) a support film on the perforated substrate, the support film having a thickness of 60 Å or less, and (iii) linkers attached on top of the support film. The linkers has at least one affinity group for immobilizing an analyte; wherein the linkers form a non-random pattern on the support film.


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