The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Oct. 22, 2024

Filed:

Oct. 04, 2022
Applicant:

Medidata Solutions, Inc., New York, NY (US);

Inventors:

Hrishikesh Karvir, Langhorne, PA (US);

Fanyi Zhang, Jersey City, NJ (US);

Jingshu Liu, Jersey City, NJ (US);

Michael Elashoff, Hillsborough, CA (US);

Christopher Bound, Perkasie, PA (US);

Assignee:

MEDIDATA SOLUTIONS, INC., New York, NY (US);

Attorneys:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G16H 10/20 (2018.01); G16H 50/30 (2018.01); G16H 50/50 (2018.01); G16H 50/70 (2018.01); G06N 3/045 (2023.01); G06N 7/01 (2023.01); G06N 20/00 (2019.01);
U.S. Cl.
CPC ...
G16H 10/20 (2018.01); G16H 50/30 (2018.01); G16H 50/50 (2018.01); G16H 50/70 (2018.01); G06N 3/045 (2023.01); G06N 7/01 (2023.01); G06N 20/00 (2019.01);
Abstract

A system for predicting subject enrollment for a study includes a time-to-first-enrollment (TTFE) model and a first-enrollment-to-last-enrollment (FELE) model for each site in the study. The TTFE model includes a Gaussian distribution with a generalized linear mixed effects model solved with maximum likelihood point estimation or with Bayesian regression, and the FELE model includes a negative binomial distribution with a generalized linear mixed effects model solved with maximum likelihood point estimation or with Bayesian regression estimation.


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