The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Oct. 22, 2024

Filed:

Oct. 15, 2021
Applicant:

SK Hynix Inc., Icheon-si, KR;

Inventors:

Jun Hyuk Lee, Icheon-si, KR;

Deung Kak Yoo, Icheon-si, KR;

Dong Jae Jung, Icheon-si, KR;

Min Kyu Lee, Icheon-si, KR;

Assignee:

SK hynix Inc., Icheon-si, KR;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G11C 29/00 (2006.01); G11C 16/04 (2006.01); G11C 16/24 (2006.01); G11C 29/50 (2006.01);
U.S. Cl.
CPC ...
G11C 29/50004 (2013.01); G11C 16/0483 (2013.01); G11C 16/24 (2013.01); G11C 2029/5004 (2013.01);
Abstract

The present technology includes a memory device, a memory system including the memory device, and a test operation of the memory device. The memory device includes a memory block connected to word lines and select lines, a bit line connected to the memory block, a voltage generator configured to generate a test voltage to be applied to a selected line among the word lines and the select lines, a page buffer configured to sense a voltage of the bit line to store and output test data, and a control logic circuit configured to determine whether a first defect exists in the memory block according to the test data.


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