The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Oct. 22, 2024
Filed:
Oct. 13, 2020
Hitachi, Ltd., Tokyo, JP;
Masato Tamura, Tokyo, JP;
Tomoaki Yoshinaga, Tokyo, JP;
Atsushi Hiroike, Tokyo, JP;
Hiromu Nakamae, Tokyo, JP;
Yuta Yanashima, Tokyo, JP;
Hitachi, Ltd., Tokyo, JP;
Abstract
An object of the invention is to configure an object search device capable of expressing information on shapes and irregularities as features only by images, in a search for an object that is characteristic in shape or irregularity, and performing an accurate search. The object search device includes: an image feature extraction unit that is configured with a first neural network, and is configured to input an image to extract an image feature; a three-dimensional data feature extraction unit that is configured with a second neural network, and is configured to input three-dimensional data to extract a three-dimensional data feature; a learning unit that is configured to extract an image feature and a three-dimensional data feature from an image and three-dimensional data of an object obtained from a same individual, respectively, and update an image feature extraction parameter so as to reduce a difference between the image feature and the three-dimensional data feature; and a search unit that is configured to extract image features of a query image and a gallery image of the object by the image feature extraction unit using the updated image feature extraction parameter, and calculate a similarity between the image features of both images to search for the object.