The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Oct. 22, 2024
Filed:
Jun. 10, 2021
Applicant:
Fujifilm Business Innovation Corp., Tokyo, JP;
Inventors:
Assignee:
FUJIFILM Business Innovation Corp., Tokyo, JP;
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G06T 7/90 (2017.01); G06T 1/00 (2006.01); G06T 1/20 (2006.01); G06T 7/00 (2017.01);
U.S. Cl.
CPC ...
G06T 7/90 (2017.01); G06T 1/0007 (2013.01); G06T 7/001 (2013.01); G06T 1/20 (2013.01);
Abstract
An inspection device includes a processor configured to acquire image information of each of a correct image and a target image as an inspection target, extract edge information of each of the correct image and the target image by using the acquired image information, obtain a difference image between the correct image and the target image, and change a threshold value for detecting a defect by using brightness information or color information of the correct image along with the edge information and detect a defect of the target image by using the difference image and the threshold value.