The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Oct. 22, 2024
Filed:
Jan. 20, 2023
Takashi Soma, Kanagawa, JP;
Takuji Kamada, Kanagawa, JP;
Takashi Soma, Kanagawa, JP;
Takuji Kamada, Kanagawa, JP;
Ricoh Company, Ltd., Tokyo, JP;
Abstract
An inspection system, an inspection method, and non-transitory recording medium. The inspection system acquires an image, captured by an image sensor, of the object to be inspected placed on a placement surface, the object having a printed image printed thereon, displays by a projector, print image data of the print image and attribute information of the object to be inspected, on the placement surface, compares a captured image of the object to be inspected with the print image data to determine whether there is a defect, and based on a determination that there is a defect, output defect information for specifying the defect.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile