The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Oct. 22, 2024

Filed:

Jan. 13, 2021
Applicant:

Fujifilm Corporation, Tokyo, JP;

Inventors:

Masaaki Oosake, Kanagawa, JP;

Makoto Ozeki, Kanagawa, JP;

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06N 3/084 (2023.01); G06T 7/00 (2017.01); G06V 10/143 (2022.01); G06V 10/32 (2022.01); G06V 10/44 (2022.01); G06V 10/60 (2022.01); G06V 10/764 (2022.01); G06V 10/776 (2022.01); G06V 10/82 (2022.01);
U.S. Cl.
CPC ...
G06N 3/084 (2013.01); G06T 7/0012 (2013.01); G06V 10/143 (2022.01); G06V 10/32 (2022.01); G06V 10/454 (2022.01); G06V 10/60 (2022.01); G06V 10/764 (2022.01); G06V 10/776 (2022.01); G06V 10/82 (2022.01); G06T 2207/20084 (2013.01); G06V 2201/03 (2022.01);
Abstract

An object of the present invention is to provide a learning apparatus and a learning method capable of appropriately learning pieces of data that belong to the same category and are acquired under different conditions. In a learning apparatus according a first aspect of the present invention, first data and second data are respectively input to a first input layer and a second input layer that are independent of each other, and feature quantities are calculated. Thus, the feature quantity calculation in one of the first and second input layers is not affected by the feature quantity calculation in the other input layer. In addition to feature extraction performed in the input layers, each of a first intermediate feature quantity calculation process and a second intermediate feature quantity calculation process is performed at least once in an intermediate layer that is shared by the first and second input layers. Thus, the feature quantities calculated from the first data and the second data in the respective input layers can be reflected in the intermediate feature quantity calculation in the intermediate layer. Consequently, pieces of data that belong to the same category and are acquired under different conditions can be appropriately learned.


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