The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Oct. 22, 2024

Filed:

Sep. 23, 2021
Applicant:

Vmware, Inc., Palo Alto, CA (US);

Inventors:

Pratik Jagad, Marietta, GA (US);

Krishna Kumar Bhavesh, Atlanta, GA (US);

Assignee:

Omnissa, LLC, Palo Alto, CA (US);

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G06F 21/57 (2013.01); G06F 21/62 (2013.01); H04M 1/725 (2021.01);
U.S. Cl.
CPC ...
G06F 21/577 (2013.01); G06F 21/6245 (2013.01); G06F 2221/033 (2013.01); H04M 1/725 (2013.01);
Abstract

Examples of managed device risk assessment are described. In one example, a copy of an application installed on a client device is decompiled, to identify operations performed during execution of the application. A profile including one or more rules that specify whether the operations are assigned higher or lower levels of risk is obtained. A first number of times that the first rule is violated by the operations is determined, and a second number of times that the second rule is violated by the operations is determined. A total of the violations is compared against a threshold, and a remedial action is initiated in response to determining that the total exceeds the threshold.


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