The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Oct. 22, 2024
Filed:
May. 13, 2021
Tencent Technology (Shenzhen) Company Limited, Shenzhen, CN;
Yao Zhang, Shenzhen, CN;
TENCENT TECHNOLOGY (SHENZHEN) COMPANY LIMITED, Shenzhen, CN;
Abstract
Provided is a command inspection method, including: inspecting a plurality of to-be-inspected commands based on a plurality of first features of known obfuscated commands and a plurality of second features of normal service commands, to determine a plurality of target commands, each of the target commands being a command having one or more of the first features but none of the second features; obtaining running state text of the plurality of target commands; obtaining suspicious degree information of the plurality of target commands based on the plurality of target commands and the corresponding running state text, the suspicious degree information being used for indicating a possibility that a command is an obfuscated command; and determining, when suspicious degree information of any target command satisfies a target condition, the target command as an obfuscated command.