The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Oct. 22, 2024

Filed:

Feb. 26, 2021
Applicant:

Kabushiki Kaisha Toshiba, Tokyo, JP;

Inventors:

Takahiro Takimoto, Yokohama, JP;

Kouta Nakata, Tokyo, JP;

Kazunori Imoto, Kawasaki, JP;

Ayana Yamamoto, Tokyo, JP;

Shun Hirao, Kawasaki, JP;

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06F 16/53 (2019.01); G06F 16/55 (2019.01); G06F 16/58 (2019.01); G06F 16/583 (2019.01); G06T 7/00 (2017.01);
U.S. Cl.
CPC ...
G06F 16/5854 (2019.01); G06F 16/53 (2019.01); G06F 16/55 (2019.01); G06F 16/5866 (2019.01); G06T 7/001 (2013.01); G06T 2207/30148 (2013.01);
Abstract

According to one embodiment, system includes a determination unit, a first storage, a second storage, a search unit and a display. The determination unit determines a feature quantity of the process-targeted manufacturing data. The first storage stores cause-unidentified manufacturing data. The second storage stores cause-identified manufacturing data. The search unit searches, based on the feature quantity of the process-targeted manufacturing data, the first storage and the second storage for the cause-unidentified manufacturing data and the cause-identified manufacturing data that have a feature quantity similar to that of the process-targeted manufacturing data. The display displays the search result.


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