The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Oct. 22, 2024

Filed:

Oct. 19, 2018
Applicant:

Nec Corporation, Tokyo, JP;

Inventors:

Akio Tajima, Tokyo, JP;

Ken-ichiro Yoshino, Tokyo, JP;

Assignee:

NEC CORPORATION, Tokyo, JP;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06F 11/36 (2006.01); G06F 7/58 (2006.01); H04L 9/08 (2006.01);
U.S. Cl.
CPC ...
G06F 11/3692 (2013.01); G06F 7/588 (2013.01); G06F 11/3688 (2013.01); H04L 9/0852 (2013.01);
Abstract

A synthetic judgment section performs synthetic judgment of randomness test for shared random numbers by combining a result of a first randomness test and a result of a second randomness test, the first randomness test being performed on the shared random numbers by a first communication device and the second randomness test being performed on the shared random numbers by a second communication device wherein a result of the synthetic judgment is safely notified to at least one of the first communication device and the second communication device, wherein the first randomness test and the second randomness test are different with respect to at least one of randomness test to be used and random number portion to be tested.


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