The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Oct. 22, 2024
Filed:
Jun. 21, 2023
International Business Machines Corporation, Armonk, NY (US);
Ilker Ender, Dublin, IE;
Austin Clifford, Glenageary, IE;
Pedro Miguel Barbas, Dunboyne, IE;
Mara Elisa de Paiva Fernandes Matias, Dublin, IE;
Hemant Asandas Bhatia, Olathe, KS (US);
International Business Machines Corporation, Armonk, NY (US);
Abstract
A computer-implemented method, system and computer program product for optimally performing stress testing against big data management systems. A set of random test queries is generated and compiled to determine the data points of the features (e.g., table type being queried) of the set of random test queries. A distance (e.g., Mahalanobis distance) is then measured between the data points of the features and the mean of a distribution of data points corresponding to each same feature of an extracted feature set. Each random test query whose distance exceeds a threshold distance is then ranked. The ranked random test queries are then executed in order of rank. Those executed random test queries which resulted in an error (e.g., system failure) are added to a log, which is used to identify those queries to perform a stress test against the big data management system.