The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Oct. 22, 2024
Filed:
Aug. 19, 2021
Wavelength selection filter, method of manufacturing wavelength selection filter, and display device
Toppan Printing Co., Ltd., Tokyo, JP;
Masashi Kawashita, Tokyo, JP;
Yukari Oda, Tokyo, JP;
Yuki Yasu, Tokyo, JP;
Yoshiko Ishimaru, Tokyo, JP;
TOPPAN PRINTING CO., LTD., Tokyo, JP;
Abstract
A wavelength selection filter includes a first high refractive index section with a thickness T1, a second high refractive index section with a thickness T2, a high refractive index layer with a refractive index n1, a projection-depression structure layer with a refractive index n2, a filling layer with a refractive index n3, a first high refractive index section with an area ratio R1, and a second high refractive index section with an area ratio R2. With n1>n2, n1>n3, and R1+R2>1, the value of T1×{n1×R1+n2×(1−R1)} is a first parameter, the value of T2×{n1×R2+n3×(1−R2)} is a second parameter, and the ratio of the second parameter to the first parameter is 0.7 or more and 1.3 or less.