The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Oct. 22, 2024
Filed:
Dec. 19, 2019
Leica Microsystems Cms Gmbh, Wetzlar, DE;
Werner Knebel, Kronau, DE;
Florian Fahrbach, Mannheim, DE;
LEICA MICROSYSTEMS CMS GMBH, Wetzlar, DE;
Abstract
A microscope includes a wide-field illuminator configured to illuminate at least one selected region of a sample, and a beam splitter configured to generate a first detection beam path and a second detection beam path. A camera detector is arranged within the first detection beam path and is configured to record images of the selected region of the sample. A point detector is arranged within the second detection beam path and is configured to acquire a predetermined subregion of the sample lying within the selected region. A detection objective, which is arranged within the first and second detection beam paths on an object side of the beam splitter. The detection objective is a common detection objective for the camera detector and the point detector.