The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Oct. 22, 2024
Filed:
Dec. 12, 2022
System and method for oscillatory eddy current correction for diffusion-weighted echo-planar imaging
GE Precision Healthcare Llc, Wauwatosa, WI (US);
GE Precision Healthcare LLC, Wauwatosa, WI (US);
Abstract
A method for correcting diffusion-weighted echo-planar imaging data (DW-EPI) includes obtaining a first reference scan with no diffusion gradients applied, a second reference scan with a diffusion gradient applied only along a frequency direction, a third reference scan with the diffusion gradient applied only along a phase direction, and a fourth reference scan with the diffusion gradient applied only along a slice direction acquired utilizing an MRI scanner, wherein the reference scans lack phase encoding. The method includes obtaining DW-EPI data acquired utilizing the MRI scanner, wherein the DW-EPI data includes phase errors due to oscillatory eddy currents causing time-varying Bshift. The method includes generating a phase correction factor based on the reference scans and correcting the phase errors due to the oscillatory eddy currents in the DW-EPI data independent of diffusion gradient direction utilizing the phase correction factor to generate corrected DW-EPI data.