The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Oct. 22, 2024

Filed:

May. 23, 2019
Applicant:

Hitachi High-tech Corporation, Tokyo, JP;

Inventors:

Kenta Imai, Tokyo, JP;

Tomoakira Kawai, Tokyo, JP;

Taku Sakazume, Tokyo, JP;

Shigeru Yano, Tokyo, JP;

Manabu Minegishi, Tokyo, JP;

Takahiro Suzuki, Tokyo, JP;

Atsushi Watanabe, Tokyo, JP;

Assignee:
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01N 35/00 (2006.01); G01N 1/10 (2006.01); G01N 1/20 (2006.01); G01N 1/22 (2006.01); G01N 1/24 (2006.01);
U.S. Cl.
CPC ...
G01N 35/0099 (2013.01); G01N 1/10 (2013.01); G01N 1/2035 (2013.01); G01N 1/2202 (2013.01); G01N 1/24 (2013.01); G01N 2001/2223 (2013.01); G01N 2035/00891 (2013.01); G01N 35/0092 (2013.01);
Abstract

Provided is an automatic analysis system that reduces a personnel burden and increases an operating rate using an autonomous mobile robot while suppressing an initial cost. The automatic analysis system includes: a plurality of devices that are disposed in an automatic analysis areaand includes analyzing unitsandincluded in an automatic analyzer; and a robotthat moves in the automatic analysis area, in which an operation screen of the analyzing unit has a first screen mode for an operator and a second screen mode for the robot and is switchable between the first screen mode and the second screen mode, and the robot obtains state information of the analyzing unit from the operation screen in the second screen mode.


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