The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Oct. 22, 2024
Filed:
Oct. 11, 2019
Hitachi High-tech Corporation, Tokyo, JP;
Tooru Miyasaka, Tokyo, JP;
Toru Shibata, Tokyo, JP;
Katsuhiro Kambara, Tokyo, JP;
Shigeki Yamaguchi, Tokyo, JP;
HITACHI HIGH-TECH CORPORATION, Tokyo, JP;
Abstract
Provided is a technique for increasing discriminating ability, preventing human error, and improving efficiency of discrimination in a discrimination operation for extracting a sample satisfying a specific condition from among a plurality of samples. A sample discrimination system according to the present disclosure is provided with a plurality of sample retaining devices for retaining samples, and a sample information query device for querying a sample retaining device that matches predetermined query information from among the plurality of sample retaining devices. The sample information query device has a query information input unit for inputting of predetermined query information, and a query information transmission unit for transmitting predetermined query information to the sample retaining devices. The sample retaining devices are each characterized by having a storage unit for storing sample information, a comparison unit for comparing predetermined query information and sample information, and a first display unit for outputting the result of comparison by the comparison unit.