The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Oct. 22, 2024
Filed:
Jul. 05, 2021
Applicant:
Daegu Gyeongbuk Institute of Science and Technology, Daegu, KR;
Inventors:
Jae Youn Hwang, Daegu, KR;
Sang Yeon Youn, Daegu, KR;
Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01N 15/14 (2024.01); G01B 11/06 (2006.01); G01N 15/1434 (2024.01); G06T 7/60 (2017.01); H04N 23/56 (2023.01); G01N 15/01 (2024.01); G01N 15/10 (2006.01);
U.S. Cl.
CPC ...
G01N 15/1434 (2013.01); G01B 11/06 (2013.01); G06T 7/60 (2013.01); H04N 23/56 (2023.01); G01N 15/01 (2024.01); G01N 2015/1006 (2013.01); G01N 2015/144 (2013.01); G01N 2015/1495 (2013.01); G06T 2207/10056 (2013.01); G06T 2207/30024 (2013.01); G06T 2207/30096 (2013.01);
Abstract
An imaging system according to an embodiment may include an ultrasonic oscillation part configured to apply ultrasonic waves to a sample, an image acquisition part configured to acquire a plurality of images of the sample deformed by the ultrasonic waves, and a computation part configured to compute a deformation rate on the basis of a change in thickness of the sample from the plurality of images, in which the computation part computes an elastic modulus of the sample on the basis of intensity of the ultrasonic waves and the deformation rate of the sample.