The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Oct. 22, 2024
Filed:
Aug. 04, 2020
Heye International Gmbh, Obernkirchen, DE;
Dirk Pörtner, Helpsen, DE;
Heye International GmbH, Obernkirchen, DE;
Abstract
A method is provided for measuring the wall thickness of hollow glass articles in a hollow glass production system, wherein the IR radiation emitted by each hollow glass article exiting the hot end of a glass forming machine is detected at least in areas mapped by a function, the same hollow glass article, after having passed through an annealing lehr, being measured in the circumferential direction with respect to a wall thickness distribution, and the detected wall thickness distribution being mapped by a function. Using correlation methods, it is checked whether the progression of the function is contained in the function, wherein if so, measured values of the wall thickness can be associated with the measured values of the IR radiation at the hot end, so that the wall thickness distribution of the hollow glass article is already known at the hot end and implementable for monitoring purposes.