The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Oct. 22, 2024

Filed:

Sep. 24, 2020
Applicant:

3m Innovative Properties Company, St. Paul, MN (US);

Inventors:

Thomas J. Strey, River Falls, WI (US);

David L. Hofeldt, Oakdale, MN (US);

Gregory J. McGill, Maplewood, MN (US);

Jay M. Krieger, Eau Claire, WI (US);

Christopher J. Rother, St. Paul, MN (US);

Paul C. Thomas, Hudson, WI (US);

Assignee:
Attorneys:
Primary Examiner:
Int. Cl.
CPC ...
G01B 11/06 (2006.01); B29C 48/10 (2019.01); B29C 48/92 (2019.01); B29C 48/88 (2019.01); B29C 48/885 (2019.01);
U.S. Cl.
CPC ...
G01B 11/06 (2013.01); B29C 48/10 (2019.02); B29C 48/92 (2019.02); B29C 48/885 (2019.02); B29C 48/913 (2019.02); B29C 2948/92152 (2019.02); B29C 2948/92428 (2019.02); B29C 2948/92647 (2019.02);
Abstract

Methods and systems of measurement for blown film lines are provided. The sensing system includes a terahertz (THz) sensor positioned adjacent to a film bubble extruded from a blown film die, and a sensor support configured to guide the THz sensor around the circumference of the film bubble to measure its film thickness.


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