The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Oct. 22, 2024

Filed:

Feb. 09, 2021
Applicant:

Assure Tech. (Hangzhou) Co., Ltd, Hangzhou, CN;

Inventor:

Shisheng Ling, Hangzhou, CN;

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
B01L 1/00 (2006.01); B01L 3/00 (2006.01); B01L 3/02 (2006.01);
U.S. Cl.
CPC ...
B01L 3/5023 (2013.01); B01L 3/021 (2013.01); B01L 2200/026 (2013.01); B01L 2200/0689 (2013.01); B01L 2200/085 (2013.01); B01L 2200/10 (2013.01); B01L 2300/0672 (2013.01); B01L 2300/069 (2013.01); B01L 2300/0877 (2013.01);
Abstract

An apparatus for collecting and testing a sample is provided. The apparatus includes a test cavity and a collecting component. The test cavity is connected to the collecting component and the test cavity and the collecting component are in a liquid communication. An inner wall of the test cavity is provided with a first step. The collecting component includes a collecting rod and an absorbing element sleeved on the collecting rod. A connecting end of the collecting rod is provided with a barb. A tail end of the barb is tapered. The barb at the connecting end is clamped to the first step to connect the test cavity with the collecting component. A collecting and testing apparatus with an integrated structure is provided. The integrated structure integrates the collection and test of a sample, reduces a product structure and an operation difficulty of subjects.


Find Patent Forward Citations

Ling, Shisheng. (2024). Apparatus and method for collecting and testing sample (U.S. Patent No. 12121892). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/12121892

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

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