The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Oct. 22, 2024

Filed:

Aug. 12, 2022
Applicant:

Canon Medical Systems Corporation, Tochigi, JP;

Inventors:

Xiaoli Li, Vernon Hills, IL (US);

Yi Qiang, Vernon Hills, IL (US);

Wenyuan Qi, Vernon Hills, IL (US);

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
A61B 6/00 (2024.01); A61B 6/03 (2006.01); G06T 11/00 (2006.01);
U.S. Cl.
CPC ...
A61B 6/5282 (2013.01); A61B 6/037 (2013.01); G06T 11/005 (2013.01); G06T 2211/424 (2013.01);
Abstract

A method is provided for determining a scatter fraction for a radiation diagnosis apparatus. The method includes acquiring an energy spectrum from list mode data obtained from a scan performed using the radiation diagnosis apparatus; determining, from the acquired list mode data, a first number of events occurring in a first energy window spanning a first energy range; determining, from the acquired list mode data, a second number of events occurring in a second window, the second energy window spanning a second energy range different from the first energy range; calculating a singles scatter fraction based on the determined first number of events and the determined second number of events; and reconstructing an image based on the acquired list mode data and the calculated singles scatter fraction.


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