The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Oct. 22, 2024

Filed:

May. 06, 2021
Applicant:

Welch Allyn, Inc., Skaneateles Falls, NY (US);

Inventors:

Lei Guo, Manlius, NY (US);

Joshua Hess, Moravia, NY (US);

Raymond A. Lia, Auburn, NY (US);

Michael T. McMahon, Syracuse, NY (US);

Alan Knieriem, Baldwinsville, NY (US);

Steven R. Slawson, Camillus, NY (US);

Assignee:

Welch Allyn, Inc., Skaneateles Falls, NY (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
A61B 1/00 (2006.01); A61B 1/04 (2006.01); A61B 1/05 (2006.01); A61B 1/227 (2006.01); A61B 3/12 (2006.01); A61B 5/00 (2006.01); G02B 23/04 (2006.01); G02B 27/10 (2006.01);
U.S. Cl.
CPC ...
A61B 1/05 (2013.01); A61B 1/0011 (2013.01); A61B 1/227 (2013.01); G02B 23/04 (2013.01); G02B 27/106 (2013.01); A61B 1/00195 (2013.01); A61B 1/042 (2013.01); A61B 3/12 (2013.01); A61B 5/0013 (2013.01); A61B 5/0077 (2013.01); A61B 5/441 (2013.01);
Abstract

An accessory that is attachable to a device comprises an image sensor and a beam splitter having a first surface and a second surface. The beam splitter is configured to impinge light upon the first surface, and split the light impinging upon the first surface into at least a first beam, a second beam, and a third beam. The first beam travels from a first opening of the device to a second opening of the device along an optical path when the accessory is attached to the device, the second beam travels from the first surface to the image sensor, and the third beam travels from the second surface to the image sensor or a beam dump.


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