The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Oct. 15, 2024

Filed:

Nov. 04, 2019
Applicant:

Bsh Hausgeräte Gmbh, Munich, DE;

Inventors:

Markus Kuchler, Gstadt am Chiemsee, DE;

Kerstin Rigorth, Mühldorf, DE;

Sebastian Sterz, Großaitingen, DE;

Matthias Vogt, Obersulm, DE;

Assignee:

BSH Hausgeräte GmbH, Munich, DE;

Attorneys:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
H05B 6/68 (2006.01); F24C 7/08 (2006.01); H05B 6/64 (2006.01); H05B 6/72 (2006.01);
U.S. Cl.
CPC ...
H05B 6/687 (2013.01); F24C 7/087 (2013.01); H05B 6/6455 (2013.01); H05B 6/725 (2013.01);
Abstract

In a method for treating food in a food handling device with a parameter configuration a measured value distribution of a surface property of the food is determined after expiration of the period of time by means of a sensor. A pattern of change is calculated from a comparison of the p-th measured value distribution with a measured value distribution determined previously. An assessment value Bq which represents a difference between a deviation of a target distribution from the measured value distribution and a deviation of the target distribution from a prediction pattern is calculated for all patterns of change stored hitherto. The prediction pattern is formed by superimposing the measured value distribution with the respective pattern of change, and the parameter configuration is set for which the assessment value Bq meets at least one predetermined criterion.


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