The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Oct. 15, 2024
Filed:
Aug. 05, 2020
Apple Inc., Cupertino, CA (US);
Weidong Yang, San Diego, CA (US);
Oghenekome Oteri, San Diego, CA (US);
Sigen Ye, Whitehouse Station, NJ (US);
Haitong Sun, Irvine, CA (US);
Hong He, Cupertino, CA (US);
Jie Cui, San Jose, CA (US);
Chunxuan Ye, San Diego, CA (US);
Wei Zeng, San Diego, CA (US);
Dawei Zhang, Saratoga, CA (US);
Chunhai Yao, Beijing, CN;
Yushu Zhang, Beijing, CN;
Yang Tang, Cupertino, CA (US);
Apple Inc., Cupertino, CA (US);
Abstract
Apparatuses, systems, and methods for channel access scheme enhancements for systems operating in unlicensed higher frequency bands. A wireless device may perform channel access detection (CAD) measurements on a channel at a first periodicity, determine a CAD metric based on the CAD measurements at a second periodicity, and select, for the channel, a first channel access scheme from a plurality of channel access schemes based on comparison of the CAD metric to a threshold. The first channel access scheme may include a first set of channel access procedures that may define physical channels and signals to utilize respective channel procedures. In instances when the CAD metric is below the threshold, the first channel access scheme may include accessing a channel using a first listen before talk (LBT) procedure that is less restrictive than a second LTB procedure used when the CAD metric is above the threshold.