The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Oct. 15, 2024

Filed:

Jan. 19, 2022
Applicant:

Verizon Patent and Licensing Inc., Basking Ridge, NJ (US);

Inventors:

Mourad B. Takla, Hillsborough, NJ (US);

Matthijs Andries Visser, Randolph, NJ (US);

Xiong Yang, Berkeley Heights, NJ (US);

Assignee:

Verizon Patent and Licensing Inc., Basking Ridge, NJ (US);

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
H04B 17/345 (2015.01); H04B 17/382 (2015.01); H04B 17/391 (2015.01); H04W 72/04 (2023.01); H04W 72/23 (2023.01); H04W 72/541 (2023.01);
U.S. Cl.
CPC ...
H04W 72/541 (2023.01); H04B 17/345 (2015.01); H04B 17/382 (2015.01); H04B 17/3912 (2015.01); H04W 72/23 (2023.01);
Abstract

One or more computing devices, systems, and/or methods are provided. A system includes a first user equipment (UE) module and a second UE module, a first base station (BS) module associated with the first UE module, and a second BS module associated with the second UE module. The first BS module is configured to send a first resource allocation map associated with the first UE module to the second BS module and at least one of the second UE module or the second BS module is configured to access a first fast fading table to determine a first fast fading parameter for the second UE module, generate a first interference metric based on the first resource allocation map and the first fast fading parameter, and modulate a data transmission between the second UE module and the second BS module based on the first interference metric.


Find Patent Forward Citations

Loading…