The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Oct. 15, 2024
Filed:
Oct. 18, 2023
Qualcomm Incorporated, San Diego, CA (US);
Jay Kumar Sundararajan, San Diego, CA (US);
Krishna Kiran Mukkavilli, San Diego, CA (US);
Taesang Yoo, San Diego, CA (US);
Naga Bhushan, San Diego, CA (US);
June Namgoong, San Diego, CA (US);
Pavan Kumar Vitthaladevuni, San Diego, CA (US);
Tingfang Ji, San Diego, CA (US);
QUALCOMM Incorporated, San Diego, CA (US);
Abstract
In an aspect, a UE obtains information (e.g., UE-specific information) associated with a set of triggering criteria (e.g., from a server, a serving network, e.g., in conjunction with or separate from a set of neural network functions) for a set of neural network functions, the set of neural network functions configured to facilitate positioning measurement feature processing at the UE, the set of neural network functions being generated dynamically based on machine-learning associated with one or more historical measurement procedures. The UE obtains positioning measurement data associated with a location of the UE, and processes the positioning measurement data into a respective set of positioning measurement features based at least in part upon the positioning measurement data and at least one neural network function from the set of neural network functions that is triggered by at least one triggering criterion from the set of triggering criteria.