The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Oct. 15, 2024
Filed:
Jul. 21, 2023
Qualcomm Incorporated, San Diego, CA (US);
Yi Huang, San Diego, CA (US);
Muhammad Sayed Khairy Abdelghaffar, San Jose, CA (US);
Hwan Joon Kwon, San Diego, CA (US);
Seyedkianoush Hosseini, San Diego, CA (US);
Seyed Ali Akbar Fakoorian, San Diego, CA (US);
Krishna Kiran Mukkavilli, San Diego, CA (US);
Tingfang Ji, San Diego, CA (US);
QUALCOMM Incorporated, San Diego, CA (US);
Abstract
A UE may identify slots to transmit and/or receive information related to one or more HARQ processes in frame structure that includes both sub-band full duplex slot types and time division duplex slot types. Based on a first slot used for control information, a UE can identify a second slot for PUSCH or PDSCH communication based on an offset between the first slot and the second determined by calculating slot offsets (e.g., based on parameters received from a base station). In some aspects, a UE may exclude certain slot duplex types (e.g., SBFD or TDD) when calculating slot offsets. In some aspects, a UE may calculate slot offsets differently for different HARQ processes corresponding to one frame. In some aspects, slot offset behaviors may be based on priority of information associated with a HARQ process.