The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Oct. 15, 2024

Filed:

Apr. 21, 2022
Applicants:

Samsung Electronics Co., Ltd., Suwon-si, KR;

Indian Institute of Science, Bangalore, Bangalore, IN;

Inventors:

Ashok Kumar Reddy Chavva, Bangalore, IN;

Neelesh B Mehta, Bangalore, IN;

Shubham Khunteta, Bangalore, IN;

Sripada Kadambar, Bangalore, IN;

Anirudh Reddy Godala, Bangalore, IN;

Chaiman Lim, Suwon-si, KR;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H04B 7/06 (2006.01); H04B 17/318 (2015.01);
U.S. Cl.
CPC ...
H04B 7/0695 (2013.01); H04B 17/318 (2015.01);
Abstract

A method is provided. The method includes receiving, by a User Equipment (UE), a plurality of transmit (Tx) beams from a Base Station (BS), on a plurality of receive (Rx) beams. The method includes determining the beam parameters associated with a plurality of Tx and Rx beam pairs changing at a frequency above a first threshold. The method includes deriving a beam selection metric for the plurality of Tx and Rx beam pairs using the associated beam parameters. The method includes identifying a subset of Tx and Rx beam pairs from the plurality of Tx and Rx beam pairs with the beam selection metric above a second threshold. The method includes prioritizing scanning of the identified subset of Tx and Rx beam pairs to select a Tx and Rx beam pair for communication.


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