The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Oct. 15, 2024
Filed:
Mar. 13, 2023
Apple Inc., Cupertino, CA (US);
Apple Inc., Cupertino, CA (US);
Abstract
This disclosure is directed to enhancing PLL performance via gain calibration and duty cycle calibration. It may be desirable to perform loop gain and duty cycle calibration simultaneously. However, doing so may result in prohibitive complexity and/or area/power penalty. To enable loop gain calibration and duty cycle calibration simultaneously, the duty cycle error and the gain error may be detected in the time domain, which may enable duty cycle calibration and loop gain calibration circuitries to share a phase detector. Detecting the duty cycle error and the loop gain error in the time domain may be accomplished by implementing an analog or digital PLL system, wherein the loop gain of the PLL system is a function of the input phase offset time.