The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Oct. 15, 2024

Filed:

Apr. 28, 2023
Applicant:

Samsung Electronics Co., Ltd., Suwon-si, KR;

Inventors:

Dongho Choi, Suwon-si, KR;

Jaeduk Han, Seoul, KR;

Yongho Song, Suwon-si, KR;

Youngho Kwak, Suwon-si, KR;

Gaeryun Sung, Seoul, KR;

Dongju Yang, Seoul, KR;

Kwanghee Choi, Suwon-si, KR;

Hyeongmin Seo, Seoul, KR;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H03L 7/08 (2006.01); H03L 7/091 (2006.01); H03L 7/099 (2006.01);
U.S. Cl.
CPC ...
H03L 7/0807 (2013.01); H03L 7/091 (2013.01); H03L 7/0998 (2013.01);
Abstract

A clock data recovery circuit includes a phase-locked loop configured to generate a plurality of clock signals having unequal phases relative to each other, in response to a received clock signal, and a phase interpolator configured to interpolate phases of the plurality of clock signals during generation of multiphase sampling clock signals. A sampling clock adjustment circuit is also provided, which is configured to generate a plurality of data symbols by sampling a received data signal at sampling time points of the multiphase sampling clock signals, and further configured to: detect, from the plurality of data symbols, a first data pattern set to have a transition point immediately before a first reference data symbol, and a second data pattern set to have a transition point immediately after a second reference data symbol, detect a first signal level of the first data pattern at a sampling time point for sampling the first reference data symbol, detect a second signal level of the second data pattern at a sampling time point for sampling the second reference data symbol, and adjust phases of the multiphase sampling clock signals according to a result of comparing the first signal level to the second signal level.


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